硅酸盐学报

Li和Sn掺杂Bi_2(Zn_(1/3)Nb_(2/3))_2O_7陶瓷的结构和介电性能

作者：张东丁士华宋天秀杨秀玲

单位：西华大学材料科学与工程学院

关键词：锌铌酸铋基陶瓷介电弛豫介电性能缺陷

分类号：TM28

出版年,卷(期):页码：2009,37(3):349-353

DOI：

摘要：

采用固相反应法制备(Bi2-xLix)(Zn2/3Nb1.1833Sn0.15)O7陶瓷,研究了Li+替代Bi3+对(Bi2-xLix)(Zn2/3Nb1.1833Sn0.15)O7陶瓷样品结构和介电性能的影响。结果表明:当Li+替代量x≤0.1时,相结构保持单一的单斜焦绿石相;在-30～130℃,介电损耗出现明显的弛豫现象;x=0.025、0.05、0.075和0.1时,样品的介电弛豫峰值温度分别为5、85、100℃和92℃。运用缺陷偶极子模型解释了介电弛豫现象,分析了介电弛豫峰值温度差异的原因,介电弛豫的不对称性符合普适弛豫定律。

(Bi2-xLix)(Zn2/3Nb1.183 3Sn0.15)O7 ceramics were prepared by a solid phase reaction method.The effects of substitution of Li+ for Bi3+ on structure and dielectric properties of(Bi2-xLix)(Zn2/3Nb1.183 3Sn0.15)O7 ceramics were investigated.The X-ray diffraction results reveal that(Bi2-xLix)(Zn2/3Nb1.183 3Sn0.15)O7 ceramics have single monoclinal pyrochlore phase when x≤0.1.A shift of the re-laxation peak for the dielectric loss was observed at-30 ℃ to 130 ℃.When x was increased from 0.025 to 0.05 and 0.075 and then 0.1,the peak temperatures of(Li-Sn)-doped samples were from 5 ℃ to 85 ℃,100 ℃ and to 92 ℃,respectively.A defect model was used to explain the dielectric relaxation.The difference in the temperature peaks of dielectric relaxation was analyzed.The asymmetry of dielectric relaxation is coincident with the universal relaxation law.

基金项目：

四川省教育厅科技基金(2006C025);; 校人才基金(R0620109)资助项目

作者简介：

参考文献：

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